Path Sensitization via Boolean Difference
Automated test pattern generation relies on algebraic methods to systematically discover test vectors for complex silicon designs.
The circuit under test implements the Boolean function F = AB + B'C + AC. Input A is suspected of having a Stuck-At-0 (SA0) fault.
Apply the Boolean difference method to derive the complete set of test vectors capable of detecting this fault. Determine the algebraic derivative dF/dA and identify the specific input combinations that sensitize the path from A to F while satisfying the fault activation criteria.
Constraints
- Assume standard Boolean algebra rules and simplifications apply.
- The fault is a single Stuck-At-0 (SA0) fault isolated to input
A. - Test vectors should be evaluated assuming a standard
ABCbit ordering.
Topics
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