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Codiode/Problems/Combinational Logic

Single Fault Activation

EasyLogic CircuitAnalyze

Manufacturing defects in silicon are modeled as nodes permanently tied to ground or power, known as stuck-at faults. Finding these defects requires generating specific input vectors that force the faulty node to behave differently than a healthy node.

A three-input combinational circuit has inputs A, B, and C. Inputs A and B feed into an AND gate to produce internal node W. Node W and input C feed into an OR gate to produce the final output Y.

A fabrication defect causes node W to be Stuck-at-0 (SA0). Determine the specific input vector required to activate this fault at the internal node.

Constraints

  • Fault activation strictly requires driving the target node to the opposite logic level of the fault.
  • Propagation of the fault to the primary output Y is a separate step and is not evaluated for pure activation.

Topics

combinationalfault-testingstuck-at

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