Mean Time Between Failures Variables
Asynchronous signal crossings inherently risk metastability, and system reliability depends entirely on maximizing the Mean Time Between Failures. The fundamental equation governing this reliability is MTBF = exp(t_r / tau) / (W * f_c * f_d).
A standard two-stage synchronizer is currently deployed between a slow sensor domain and a high-speed processing domain operating at clock clk_dest. The processor architecture is undergoing an upgrade, causing the frequency of clk_dest to exactly double. The silicon technology node remains unchanged.
Evaluate the impact of this frequency scaling on the synchronizer parameters. Determine the necessary architectural adjustments to maintain or exceed the original system reliability.
Constraints
- Assume setup time and clock-to-q delay are negligible compared to the clock period for theoretical calculations.
- The parameters
tauandWare fixed constants tied to the physical silicon process. - A standard two-stage synchronizer provides exactly one clock cycle of resolution time.
Topics
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